High-Reliability Large-Capacity Embedded Flash IP
High reliability: Supports -40℃ to 125℃ junction temperature range, endurance up to 100K program/erase cycles, data retention over 10 years at 125℃, meeting AEC-Q100 Grade 1
Functional safety: Provide ECC and EDWS error detection and warning system, supports Margin Read, providing hardware foundation for ISO 26262 functional safety certification
High performance: Asynchronous interface with max read access time (Tkq) of 48ns; supports random read, program, and sector/page/chip erase
High area efficiency:Strong process compatibility; density customizable per application to reduce overall system cost
Suitable for body control unit (ECU), power management and other automotive electronics, MCU/ASIC applications
100K endurance
>10 years retention at 125℃
Meets AEC-Q100
Grade 1
Provide ECC & EDWS
for ISO 26262
Asynchronous interface
48ns max access time
Only 3 additional
mask layers
Small area design
customizable density
-40℃ to 125℃
junction temperature
Automotive Electronics
ECU code execution and
data logging
PMIC
MCU / ASIC
Industrial Control
Consumer Electronics
