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P1800

P1800

Precision Source Measure Unit（SMU）

Very-High-Frequency Noise 1/f Noise & RTN & Thermal Noise High Accuracy & Wide Impedance Range

The P1800 Series Precision Source Measure Unit (SMU) is an  easy-to-use and cost-effective electrical testing solution offering comprehensive measurement functionalities, designed to meet a wide range of high-accuracy and high-speed electrical testing requirements across research, development and production in both educational and industrial manufacturing sectors.

  • Compact design integrating DC IV testing, pulsed IV testing, 2-wire and 4-wire resistance measurements, transient time-domain sampling, and arbitrary waveform generation and measurement.

  • Optimize for diverse applications across various devices, materials and circuits, featuring a wide measurement range, high accuracy and fast measurement speed.

  • Multiple sweep modes and custom waveform functions, supporting linear, logarithmic and list sweeps, DC and pulse sweep operations, with results displayed in both numerical  and graphical formats.

  • Comprehensive control interfaces, supporting compatible control commands with mainstream devices, support high-speed triggering and synchronization between multiple units, suitable for parallel testing to improve test efficiency.

  • A 7-inch interactive touchscreen and graphical user interface make it intuitive and easy to use.

  • LabExpress Community Edition accelerates electrical characterization and analysis.

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Highlights

  • Compact Design

    Space-saving design
    ideals for benchtop operation
    or high-density system integration

  • All-in-one Characterization

    Delivers high-precision measurement
    including DC IV, pulse IV, resistance,
    transient time-domain sampling testing,
    and custom waveform generation/analysis

  • High Performance

    Wide measurement range of 200V / 1A,
    current resolution down to 0.1fA,
    current accuracy up to 100fA,
    transient sampling rate up to 1MS/s

  • Seamless Compatibility

    Compatible with mainstream models,
    support controlling via USB,
    LAN, GPIB interfaces and
    open APIs.

  • Wide Applications

    Wide test applications coverage
    across semiconductor devices, advanced
    materials characterization, circuit validation,
    and wafer-level reliability assessment

  • User-Friendly Operation

    7-inch touchscreen
    with intuitive graphical interface
    Free LabExpress community edition PC software
    improves testing and analysis efficiency

Applications

  • IV Testing for
    Electronic Components & Discrete Devices

  • Electrical Characterization of
    Metallic & 2D Materials

  • Electrical Characterization of
    Graphene & Carbon Nanotube

  • IV Testing
    for LED &
    Thin-Film
    Transistor

  • Analog Circuit
    Design Verification

  • Photodetector
    Performance Testing

  • MEMS and Sensor
    Performance Testing

  • Wafer-Level
    Reliability Testing

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