FastLab™ is a generic semiconductor parameter measurement software designed for on-wafer device characterization. FastLab™ implements automated measurement through dynamic interactions with probe stations and instruments.
Supports mainstream instruments and probe stations.
Friendly user interface and easy to operate. Comprehensive built-in device list, while also serving customized devices. Various built-in current voltage/capacitance voltage (IV/CV) Spec analyses to simplify the measurement particularly for the fresh user.
- Accommodates both manual and automated measurement. Capable of loading die and sub-die settings from probe station. Offers manual and auto save of measured data.
- Highly integrated GUI helps users to quickly set up meters, switching matrix and probe stations. Straightforward device settings via referencing to built-in routines. Convenient for batch-measurements, allows for one-click exporting from and importing to.xls format files. Measured cures can be displayed in multiple ways as per users’ request. Reporting available in pdf/docx/ppt formats.
- Support dat and xls data file format, compatible with BSIMProPlus and MeqLab modeling tool.
Supports generic semiconductor devices for both IV/CV measurements and reliability measurements.
Enables either manual or auto on-chip measurements through communication with semi-auto probe stations, effectively switching matrix and IV/CV meters through GPIB.
Supported Instrument List
Keysight E5250A/B2200, Keithley K707
Cascade Semi-Auto S300/E300/CM300
MPI Semi-Auto TS2000/TS3000
Operating System: Windows XP or above
Hardware Requirements: Pentium 4-core CPU, 1GB RAM or above