Comprehensive Semiconductor Parameter Measurement Software


FastLab is a comprehensive semiconductor parameter measurement software package designed for on-wafer device characterization.

FastLab performs automated measurement through dynamic interactions with mainstream probe stations and instruments.

Key Advantage

FastLab features a friendly user interface and easy to operate. FastLab incudes a comprehensive built-in device list, and allows the user to define custom devices. Various built-in current-voltage/capacitance- voltage (IV/CV) spec analyses simplify the measurement tasks, especially for a new user.




Accommodates both manual and automated measurement. Capable of loading die and sub-die settings from probe station. Offers manual and auto save of measured data.    


Highly integrated GUI helps users to quickly set up meters, switching matrix and probe stations. Straightforward device settings via referencing to built-in routines. Convenient for batch-measurements, allows for one-click exporting from and importing to.xls format files. Measured cures can be displayed in multiple ways as per users’request. Reporting available in pdf/docx/ppt formats.





Support dat and xls data file format, compatible with BSIMProPlus and MeqLab modeling tool.    


Supports generic semiconductor devices for both IV/CV measurements and reliability measurements.

Enables either manual or auto on-chip measurements through communication with semi-auto probe stations, effectively switching matrix and IV/CV meters through GPIB.



  • Supported Instrument List

-- Meter

-- Keysight B1500/HP4284/HP4156/E4980

-- Switching Matrix

-- Keysight E5250A/B2200, Keithley K707

  • Probe Station

-- Cascade Semi-Auto S300/E300/CM300

-- MPI Semi-Auto TS2000/TS3000

  • Requirements

-- Operating System: Windows XP or above

-- Hardware Requirements: Pentium 4-core CPU, 1GB RAM or above