Introduction

BSIMProPlus is industry's leading SPICE modeling platform for advanced semiconductor devices. As the technology and market leader for SPICE modeling, it has been adopted as the standard modeling tool in leading semiconductor companies worldwide for over a decade.

BSIMProPlus provides the most powerful SPICE modeling functions with its built-in parallel SPICE engine. BSIMProPlus offers full SPICE modeling capabilities from baseband to high frequency for various semiconductor devices for characterization, auto model extraction and parameter optimization in various technology nodes including 28nm, 14nm, 10nm, 7nm, 5nm and 3nm.

BSIMProPlus supports public domain SPICE models and popular proprietary models, and represents accurate and efficient SPICE modeling solution for process development and integrated circuit design.

Key Advantage

Golden modeling tool in most leading foundries and IDMs

Most complete and powerful SPICE modeling functions leveraging a decade of development and industrial use

Accurate and efficient parameter extraction and optimization engines

Build-in true SPICE simulator Unique AgeMOS reliability model testing and extraction solution

Supports MOSRA model and user-defined PRI model

Advanced modeling technologies supports all advanced process nodes, and many different types of devices and models

Applications

Advanced semiconductor process development

Semiconductor device characteristics testing

PDK/SPICE model library development

SPICE model customization and validation

Aging model development and validation

Specifications

• Supports device types 

-- MOSFET, SOI, FinFET, BJT/HBT, TFT, MESFET, HEMT, Diode, Resistor, Inductor, etc

• Supports models

-- BSIM3, BSIM4, BSIM6, BSIM-CMG, BSIM-IMG, BSIMSOI, UTSOI, HiSIM2, HiSIM_HV, PSP, GP-BJT, RPI TFT, etc

-- Continuously updated with the latest compact model versions such as BSIM4.8.1, BSIM-BULK 107.0, BSIM-CMG 111.1, BSIM IMG 103.0

• Supports latest model interface

-- TMI, OMI and PMI Supports device characteristics

-- DC, AC, Tran, Noise, RF, Statistical, LDE, Reliability, etc

-- Supports user-defined model and Verilog-A model

-- Hspice/Spectre/Eldo compatible

• Supports Device or circuit-level target modeling
• Supports model auto extraction and parameter optimization
• Supports Popular instruments from Keysight (Agilent)/Keithley for DC/AC/RF/Reliability characterization
• Supports Cascade/SUSS/MPI probe station for wafer-level semi-auto measurement 

 Application Example