Introduction

FastLab is a generic semiconductor parameter measurement software designed for on-wafer device characterization.

FastLab implements automated measurement through dynamic interactions with probe stations and instruments.Supports mainstream instruments and probe stations.

Key Advantage

Supports mainstream instruments and probe stations .Friendly user interface and easy to operate .Comprehensive built-in device list, while also serving customized devices.Various built-in current.voltage/capacitance voltage (IV/CV).Spec analyses to simplify the measurement particularly for the fresh user

Accommodates both manual and automated measurement. Capable of loading die and sub-die settings from probe station. Offers manual and auto save of measured data.

Highly integrated GUI helps users to quickly set up meters, switching matrix and probe stations. Straightforward device settings via referencing to built-in routines. Convenient for batch-measurements, allows for one-click exporting from and importing to.xls format files. Measured cures can be displayed in multiple ways as per users’request. Reporting available in pdf/docx/ppt formats.

Support dat and xls data file format, compatible with BSIMProPlus and MeqLab modeling tool.

Applications

Supports generic semiconductor devices for both IV/CV measurements and reliability measurements.

Enables either manual or auto on-chip measurements through communication with semi-auto probe stations, effectively switching matrix and IV/CV meters through GPIB.

Specifications

Supported Instrument List

Meter

Keysight B1500/HP4284/HP4156/E4980

Switching Matrix

Keysight E5250A/B2200, Keithley K707

Probe Station

Cascade Semi-Auto S300/E300/CM300

MPI Semi-Auto TS2000/TS3000

Requirements

Operating System: Windows XP or above

Hardware Requirements: Pentium 4-core CPU, 1GB RAM or above

Products

Simulation

Simulation Overview

Brief Intro of Simulation Productline

NanoSpice

Universal Parallel SPICE

NanoSpice Giga

Large Capacity & High Precision SPICE

NanoSpice Pro

Dual Solver & High Performance FastSPICE

NanoYield

Yield Oriented Design Platform

NanoWave

High Capacity Waveform Viewer

Modeling&PDK

Modeling&PDK Overview

Brief Intro of Modeling&PDK Productline

BSIMProPlus

Advanced SPICE Modeling Platform

SDEP

Intelligent Model Extraction Platform

MeQLab

Cross-platform Modeling Software

ME-Pro

Process and Design Verification Platform

PQLab

Advanced PDK Verification Platform

Test

FS-Pro

All-In-One Semiconductor Parameter Analyzer

9812DX

Low Frequency Noise Measurement System

FastLab

Generic Semiconductor Parameter Measurement Software

Service

Testing Lab

Advanced Wafer Testing Platform

Engineering Center

Advanced Semiconductor Engineering Service