The International Conference on Microelectronic Test Structures (ICMTS) is the premier conference devoted to the development, measurement and analysis of test structures, providing a forum for designers and users of test structures to discuss recent developments and future directions. The meeting is an IEEE conference, sponsored by the IEEE Electron Devices Society. Unlike other large-scale conferences, this highly focused one offers participants the opportunity for in-depth exchanges.
The International Conference on Microelectronic Test Structures (ICMTS)
is the premier conference devoted to the development, measurement and analysis
of test structures, providing a forum for designers and users of test
structures to discuss recent developments and future directions. The meeting is
a IEEE conference, sponsored by the IEEE Electron Devices Society. Unlike other
large-scale conferences, this highly focused one offers participants the
opportunity for in-depth exchanges.
As a long-term sponsor of ICMTS, Primarius Technologies set up a virtual exhibition booth in ICMTS 2020 and presented the latest information about our product and technology progress. This year, Primarius emphasized on the introduction of newly updated 9812DX and FS-Pro and details were available from our experts:
https://event.on24.com/wcc/r/2291941/AA71CAFF90EF2002E9571624F0DE0E3D.
At the beginning
of May, Primarius Technologies completed the important upgrades of the gold
low-frequency noise measuring system 9812DX and the AI-driven integrated
parameter testing system FS-Pro. The functions of these two products are more
complete and the performances have been greatly improved.
About 9812DX:
Adopted by all leading foundries, top IDMs and design companies as
a standard noise measuring system
Its reliability and accuracy have been verified by
more than 100 customers over 20 years
Support the most complete device types and provide
the highest resolution with built-in multiple current/voltage amplifiers
Empower high-precision silicon level noise
measurement under the widest voltage, current and impedance range
Industry No. 1 in measuring speed and parallel
throughput with guaranteed accuracy
Applicable to all advanced process nodes
About FS-Pro:
AI-driven integrated high precision IV, CV and 1/f noise testing
system
Testing speed can be 10X compared with traditional
testing schemes
Extend easily to support production test with modular
architecture
Embedded control software LabExpress for powerful
analysis
Advanced options for industrial needs such as
semi-automatic prober station, third-party instruments and reliability test
Wide range of up to 200V, 1A (3A pulse), and accuracy
of 30fA
Scalable to a complete testing, modeling and
simulating system with optional built-in modeling and simulation software (BPP
/ MeQLab / NanoSpice)
Lower SMU noise and faster DC testing speed can
further accelerate 9812